Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray...

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Bibliographic Details
Main Authors: Kirkwood, H., de Jonge, M., Howard, D., Ryan, C., van Riessen, G., Hofmann, F., Rowles, Matthew, Paradowska, A., Abbey, B.
Format: Journal Article
Published: International Centre for Diffraction Data 2017
Online Access:http://hdl.handle.net/20.500.11937/60260
Description
Summary:Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil.

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