Uncovering the true nature of deformation microstructures using 3D analysis methods
© Published under licence by IOP Publishing Ltd.Three-dimensional electron backscatter diffraction (3D EBSD) has emerged as a powerful technique for generating 3D crystallographic information in reasonably large volumes of a microstructure. The technique uses a focused ion beam (FIB) as a high preci...
| Main Authors: | , , , , , , , , |
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| Format: | Conference Paper |
| Published: |
2015
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| Online Access: | http://hdl.handle.net/20.500.11937/54361 |