APA (7th ed.) Citation

Reischl, B., Raiteri, P., Gale, J., & Rohl, A. (2016). Can Point Defects in Surfaces in Solution be Atomically Resolved by Atomic Force Microscopy? The American Physical Society.

Chicago Style (17th ed.) Citation

Reischl, Bernhard, Paolo Raiteri, Julian Gale, and Andrew Rohl. Can Point Defects in Surfaces in Solution Be Atomically Resolved by Atomic Force Microscopy? The American Physical Society, 2016.

MLA (9th ed.) Citation

Reischl, Bernhard, et al. Can Point Defects in Surfaces in Solution Be Atomically Resolved by Atomic Force Microscopy? The American Physical Society, 2016.