Can Point Defects in Surfaces in Solution be Atomically Resolved by Atomic Force Microscopy?
While the atomic force microscope (AFM) is able to image mineral surfaces in solution with atomic resolution, so far, it has been a matter of debate whether imaging point defects is also possible under these conditions. The difficulties stem from the limited knowledge of what types of defects may be...
| Main Authors: | , , , |
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| Format: | Journal Article |
| Published: |
The American Physical Society
2016
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| Online Access: | http://hdl.handle.net/20.500.11937/50825 |