Indentation and imprint mapping for the identification of material properties in multi-layered systems
Multi-layered thin films have become popular thanks to their ability to enhance the performance, stiffness and strength of a component. In order to verify that the above properties are achieved in a production process, it is necessary to have reliable techniques to measure the mechanical parameters...
| Main Authors: | , , , |
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| Format: | Journal Article |
| Published: |
Elsevier
2011
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| Online Access: | http://hdl.handle.net/20.500.11937/50257 |