Synchrotron-based XPS studies of AlGaN and GaN surface chemistry and its relationship to ion sensor behaviour

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Synchrotron-based XPS studies of AlGaN and GaN surface chemistry and its relationship to ion sensor behaviour

Soft X-ray photoelectron spectroscopy was used to investigate the fundamental surface chemistry of both AlGaN and GaN surfaces in the context of understanding the behaviour of AlGaN/GaN heterostructures as chemical field-effect transistor (CHEMFET) ion sensors. AlGaN and GaN samples were subjected t...

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Bibliographic Details
Main Authors:	Khir, F.L.M., Myers, M., Podolska, Anna, Sanders, T.M., Baker, M., Nener, B., Parish, G.
Format:	Journal Article
Published:	Elsevier BV North-Holland 2014
Online Access:	http://hdl.handle.net/20.500.11937/49525

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