Synchrotron-based XPS studies of AlGaN and GaN surface chemistry and its relationship to ion sensor behaviour
Soft X-ray photoelectron spectroscopy was used to investigate the fundamental surface chemistry of both AlGaN and GaN surfaces in the context of understanding the behaviour of AlGaN/GaN heterostructures as chemical field-effect transistor (CHEMFET) ion sensors. AlGaN and GaN samples were subjected t...
| Main Authors: | , , , , , , |
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| Format: | Journal Article |
| Published: |
Elsevier BV North-Holland
2014
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| Online Access: | http://hdl.handle.net/20.500.11937/49525 |