Khir, F., Myers, M., Podolska, A., Sanders, T., Baker, M., Nener, B., & Parish, G. (2014). Synchrotron-based XPS studies of AlGaN and GaN surface chemistry and its relationship to ion sensor behaviour. Elsevier BV North-Holland.
Chicago Style (17th ed.) CitationKhir, F.L.M, M. Myers, Anna Podolska, T.M Sanders, M. Baker, B. Nener, and G. Parish. Synchrotron-based XPS Studies of AlGaN and GaN Surface Chemistry and Its Relationship to Ion Sensor Behaviour. Elsevier BV North-Holland, 2014.
MLA (9th ed.) CitationKhir, F.L.M, et al. Synchrotron-based XPS Studies of AlGaN and GaN Surface Chemistry and Its Relationship to Ion Sensor Behaviour. Elsevier BV North-Holland, 2014.
Warning: These citations may not always be 100% accurate.