$Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction$
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Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

Bibliographic Details
Main Authors:	Chen, Q., Mao, W., Zhou, Y., Lu, Chungsheng
Format:	Journal Article
Published:	Elsevier BV North-Holland 2010
Online Access:	http://hdl.handle.net/20.500.11937/48014

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