Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

Bibliographic Details
Main Authors: Chen, Q., Mao, W., Zhou, Y., Lu, Chungsheng
Format: Journal Article
Published: Elsevier BV North-Holland 2010
Online Access:http://hdl.handle.net/20.500.11937/48014

Internet

http://hdl.handle.net/20.500.11937/48014

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