Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
| Main Authors: | , , , |
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| Format: | Journal Article |
| Published: |
Elsevier BV North-Holland
2010
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| Online Access: | http://hdl.handle.net/20.500.11937/48014 |
| _version_ | 1848757992583856128 |
|---|---|
| author | Chen, Q. Mao, W. Zhou, Y. Lu, Chungsheng |
| author_facet | Chen, Q. Mao, W. Zhou, Y. Lu, Chungsheng |
| author_sort | Chen, Q. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| first_indexed | 2025-11-14T09:36:54Z |
| format | Journal Article |
| id | curtin-20.500.11937-48014 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T09:36:54Z |
| publishDate | 2010 |
| publisher | Elsevier BV North-Holland |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-480142017-09-13T15:59:40Z Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction Chen, Q. Mao, W. Zhou, Y. Lu, Chungsheng 2010 Journal Article http://hdl.handle.net/20.500.11937/48014 10.1016/j.apsusc.2010.05.071 Elsevier BV North-Holland fulltext |
| spellingShingle | Chen, Q. Mao, W. Zhou, Y. Lu, Chungsheng Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction |
| title | Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction |
| title_full | Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction |
| title_fullStr | Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction |
| title_full_unstemmed | Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction |
| title_short | Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction |
| title_sort | effect of young's modulus evolution on residual stress measurement of thermal barrier coatings by x-ray diffraction |
| url | http://hdl.handle.net/20.500.11937/48014 |