APA (7th ed.) Citation

Chen, Q., Mao, W., Zhou, Y., & Lu, C. (2010). Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction. Elsevier BV North-Holland.

Chicago Style (17th ed.) Citation

Chen, Q., W. Mao, Y. Zhou, and Chungsheng Lu. Effect of Young's Modulus Evolution on Residual Stress Measurement of Thermal Barrier Coatings by X-ray Diffraction. Elsevier BV North-Holland, 2010.

MLA (9th ed.) Citation

Chen, Q., et al. Effect of Young's Modulus Evolution on Residual Stress Measurement of Thermal Barrier Coatings by X-ray Diffraction. Elsevier BV North-Holland, 2010.