Analysis of high resolution X-ray CT images of Bentheim Sandstone under elevated confining pressures
A sample of Bentheim sandstone was characterized using high-resolution three-dimensional X-ray microscopy at two different confining pressures of 1 MPa and 20 MPa. The two recordings can be directly compared with each other because the same sample volume was imaged in either case. After image proces...
| Main Authors: | , , , , , , |
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| Format: | Journal Article |
| Published: |
Wiley-Blackwell
2016
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| Online Access: | http://hdl.handle.net/20.500.11937/47465 |