Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly
Thermo-mechanical stresses have been considered as one of the major concern in electronic Packaging assembly structural failure. The interfacial stresses are often caused by the thermal mismatch stresses induced by the coefficient of thermal expansion (CTE) difference between materials, typically du...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Conference Paper |
| Published: |
AMPT2012
2012
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| Online Access: | http://hdl.handle.net/20.500.11937/46330 |
| _version_ | 1848757527410376704 |
|---|---|
| author | Debnath, Sujan Pang, X. Rahman, Ekhlasur Moola, Mohan Reddy |
| author2 | Prof. A Kiet Tieu |
| author_facet | Prof. A Kiet Tieu Debnath, Sujan Pang, X. Rahman, Ekhlasur Moola, Mohan Reddy |
| author_sort | Debnath, Sujan |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | Thermo-mechanical stresses have been considered as one of the major concern in electronic Packaging assembly structural failure. The interfacial stresses are often caused by the thermal mismatch stresses induced by the coefficient of thermal expansion (CTE) difference between materials, typically during the high temperature change in the bonding process. This research work examined the effect of bond layer on thermal mismatch inter-facial stresses in a bi-layered assembly. The paper verified the existing thermal mismatch solder bonded bi-layered analytical model using finite element method (FEM) simulation. The parametric studies on the effect of change of the bond layer properties were carried out in order to provide useful reference for interfacial stress evaluation and the electronic packaging assembly design. These parameters included CTE, temperature, thickness, and stiffness (compliant and stiff bond) of the bond layer. The recent development on the lead free bonding material was being reviewed and found to have enormous potential and key role to address the future electronic packaging assembly reliability. |
| first_indexed | 2025-11-14T09:29:31Z |
| format | Conference Paper |
| id | curtin-20.500.11937-46330 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T09:29:31Z |
| publishDate | 2012 |
| publisher | AMPT2012 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-463302017-01-30T15:26:26Z Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly Debnath, Sujan Pang, X. Rahman, Ekhlasur Moola, Mohan Reddy Prof. A Kiet Tieu Thermo-mechanical stresses have been considered as one of the major concern in electronic Packaging assembly structural failure. The interfacial stresses are often caused by the thermal mismatch stresses induced by the coefficient of thermal expansion (CTE) difference between materials, typically during the high temperature change in the bonding process. This research work examined the effect of bond layer on thermal mismatch inter-facial stresses in a bi-layered assembly. The paper verified the existing thermal mismatch solder bonded bi-layered analytical model using finite element method (FEM) simulation. The parametric studies on the effect of change of the bond layer properties were carried out in order to provide useful reference for interfacial stress evaluation and the electronic packaging assembly design. These parameters included CTE, temperature, thickness, and stiffness (compliant and stiff bond) of the bond layer. The recent development on the lead free bonding material was being reviewed and found to have enormous potential and key role to address the future electronic packaging assembly reliability. 2012 Conference Paper http://hdl.handle.net/20.500.11937/46330 AMPT2012 fulltext |
| spellingShingle | Debnath, Sujan Pang, X. Rahman, Ekhlasur Moola, Mohan Reddy Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| title | Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| title_full | Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| title_fullStr | Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| title_full_unstemmed | Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| title_short | Performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| title_sort | performance study of solder bond on thermal mismatch stresses in electronic packaging assembly |
| url | http://hdl.handle.net/20.500.11937/46330 |