Free energy approaches for modeling atomic force microscopy in liquids
High resolution atomic force microscopy (AFM) in liquids offers atomic scale insight into the structure at water/solid interfaces and is perhaps the only tool capable of resolving the nature of formed hydration layers. However, convolution between the imaging signal and the tip/surface interactions...
| Main Authors: | , , |
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| Format: | Journal Article |
| Published: |
AMER CHEMICAL SOC
2013
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| Online Access: | http://hdl.handle.net/20.500.11937/45909 |