Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy

Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy

With the ability to image both topography and contact potential difference simultaneously, Kelvin probe force microscopy (KPM) is an effective tool for the electrical characterisation of diamond surfaces. In this work we measure variations in contact potential difference across the surfaces of boron...

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Bibliographic Details
Main Authors: Lay, J., O'Donnell, Kane, May, P.
Format: Journal Article
Published: Elsevier BV 2011
Online Access:http://hdl.handle.net/20.500.11937/45567

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