Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy
With the ability to image both topography and contact potential difference simultaneously, Kelvin probe force microscopy (KPM) is an effective tool for the electrical characterisation of diamond surfaces. In this work we measure variations in contact potential difference across the surfaces of boron...
| Main Authors: | , , |
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| Format: | Journal Article |
| Published: |
Elsevier BV
2011
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| Online Access: | http://hdl.handle.net/20.500.11937/45567 |