Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy
With the ability to image both topography and contact potential difference simultaneously, Kelvin probe force microscopy (KPM) is an effective tool for the electrical characterisation of diamond surfaces. In this work we measure variations in contact potential difference across the surfaces of boron...
| Main Authors: | , , |
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| Format: | Journal Article |
| Published: |
Elsevier BV
2011
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| Online Access: | http://hdl.handle.net/20.500.11937/45567 |
| _version_ | 1848757321651453952 |
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| author | Lay, J. O'Donnell, Kane May, P. |
| author_facet | Lay, J. O'Donnell, Kane May, P. |
| author_sort | Lay, J. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | With the ability to image both topography and contact potential difference simultaneously, Kelvin probe force microscopy (KPM) is an effective tool for the electrical characterisation of diamond surfaces. In this work we measure variations in contact potential difference across the surfaces of boron-doped diamond films in order to investigate work function variations caused by surface features. Significantly, we demonstrate work function variations in excess of 300 mV across the surfaces of two differently prepared diamond films. Variations of this magnitude may have implications for the use of diamond in a number of electronic applications. |
| first_indexed | 2025-11-14T09:26:14Z |
| format | Journal Article |
| id | curtin-20.500.11937-45567 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T09:26:14Z |
| publishDate | 2011 |
| publisher | Elsevier BV |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-455672017-09-13T14:26:49Z Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy Lay, J. O'Donnell, Kane May, P. With the ability to image both topography and contact potential difference simultaneously, Kelvin probe force microscopy (KPM) is an effective tool for the electrical characterisation of diamond surfaces. In this work we measure variations in contact potential difference across the surfaces of boron-doped diamond films in order to investigate work function variations caused by surface features. Significantly, we demonstrate work function variations in excess of 300 mV across the surfaces of two differently prepared diamond films. Variations of this magnitude may have implications for the use of diamond in a number of electronic applications. 2011 Journal Article http://hdl.handle.net/20.500.11937/45567 10.1016/j.cplett.2011.09.023 Elsevier BV restricted |
| spellingShingle | Lay, J. O'Donnell, Kane May, P. Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy |
| title | Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy |
| title_full | Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy |
| title_fullStr | Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy |
| title_full_unstemmed | Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy |
| title_short | Workfunction variation across surface of an H-terminated diamond film measured using Kelvin probe force microscopy |
| title_sort | workfunction variation across surface of an h-terminated diamond film measured using kelvin probe force microscopy |
| url | http://hdl.handle.net/20.500.11937/45567 |