Characterisation of the interface adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test numerical model

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Characterisation of the interface adhesion of elastic-plastic thin film/rigid substrate systems using a pressurized blister test numerical model

Bibliographic Details
Main Authors:	Jiang, L., Zhou, Y., Hao, H., Liao, Y., Lu, Chungsheng
Format:	Journal Article
Published:	Elsevier Ltd 2010
Online Access:	http://hdl.handle.net/20.500.11937/45166

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