NanoSIMS investigation of passive oxide films on high-Cr cast iron
The discrete depth characteristics of thin passive oxide films were investigated using high-resolution electron microprobe and nanoscale secondary ion mass spectrometry (NanoSIMS). A novel NanoSIMS method involving a Cs layer deposition before Cs+ sputtering was employed for the first time to determ...
| Main Authors: | , , , |
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| Format: | Journal Article |
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Pergamon
2013
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| Online Access: | http://hdl.handle.net/20.500.11937/4454 |
| _version_ | 1848744520133378048 |
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| author | Salasi, Mobin Stachowiak, Gwidon Stachowiak, G. Kilburn, M. |
| author_facet | Salasi, Mobin Stachowiak, Gwidon Stachowiak, G. Kilburn, M. |
| author_sort | Salasi, Mobin |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | The discrete depth characteristics of thin passive oxide films were investigated using high-resolution electron microprobe and nanoscale secondary ion mass spectrometry (NanoSIMS). A novel NanoSIMS method involving a Cs layer deposition before Cs+ sputtering was employed for the first time to determine the elemental distribution at different sub-layers of a passive film. The film was formed in air on the surface of a multi-phase microstructure of high-chromium cast iron (HCCI). It was found that the film composition and thickness varied according to the underlying microstructure phase. Based on the microprobe and NanoSIMS results, the influence of the HCCI passive film thickness and composition on the localized passivity breakdown has been proposed. |
| first_indexed | 2025-11-14T06:02:46Z |
| format | Journal Article |
| id | curtin-20.500.11937-4454 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T06:02:46Z |
| publishDate | 2013 |
| publisher | Pergamon |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-44542017-09-13T15:54:29Z NanoSIMS investigation of passive oxide films on high-Cr cast iron Salasi, Mobin Stachowiak, Gwidon Stachowiak, G. Kilburn, M. EPMA alloy interfaces passive films SIMS The discrete depth characteristics of thin passive oxide films were investigated using high-resolution electron microprobe and nanoscale secondary ion mass spectrometry (NanoSIMS). A novel NanoSIMS method involving a Cs layer deposition before Cs+ sputtering was employed for the first time to determine the elemental distribution at different sub-layers of a passive film. The film was formed in air on the surface of a multi-phase microstructure of high-chromium cast iron (HCCI). It was found that the film composition and thickness varied according to the underlying microstructure phase. Based on the microprobe and NanoSIMS results, the influence of the HCCI passive film thickness and composition on the localized passivity breakdown has been proposed. 2013 Journal Article http://hdl.handle.net/20.500.11937/4454 10.1016/j.corsci.2012.11.003 Pergamon restricted |
| spellingShingle | EPMA alloy interfaces passive films SIMS Salasi, Mobin Stachowiak, Gwidon Stachowiak, G. Kilburn, M. NanoSIMS investigation of passive oxide films on high-Cr cast iron |
| title | NanoSIMS investigation of passive oxide films on high-Cr cast iron |
| title_full | NanoSIMS investigation of passive oxide films on high-Cr cast iron |
| title_fullStr | NanoSIMS investigation of passive oxide films on high-Cr cast iron |
| title_full_unstemmed | NanoSIMS investigation of passive oxide films on high-Cr cast iron |
| title_short | NanoSIMS investigation of passive oxide films on high-Cr cast iron |
| title_sort | nanosims investigation of passive oxide films on high-cr cast iron |
| topic | EPMA alloy interfaces passive films SIMS |
| url | http://hdl.handle.net/20.500.11937/4454 |