NanoSIMS investigation of passive oxide films on high-Cr cast iron
The discrete depth characteristics of thin passive oxide films were investigated using high-resolution electron microprobe and nanoscale secondary ion mass spectrometry (NanoSIMS). A novel NanoSIMS method involving a Cs layer deposition before Cs+ sputtering was employed for the first time to determ...
| Main Authors: | , , , |
|---|---|
| Format: | Journal Article |
| Published: |
Pergamon
2013
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.11937/4454 |