Automated mapping of K-feldspar by electron backscatter diffraction (EBSD) and application to 40Ar/39Ar dating
The ability to quantify feldspar microstructure using the electron backscatter diffraction (EBSD) method has direct application in the study of rock deformation and strain kinematics. However, automated EBSD analysis of low symmetry phases, such as feldspar, has previously proven difficult. Here, we...
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| Format: | Journal Article |
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Pergamon-Elsevier Science Ltd.
2008
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| Online Access: | http://hdl.handle.net/20.500.11937/41674 |