Use of energy-filtered photoelectron emission microscopy and Kelvin probe force microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion
Kelvin probe force microscopy (KPFM) and energy-filtered photoelectron emission microscopy (EF-PEEM) with vacuum UV (VUV) excitation have been used to study the work function of p-type diamond films treated to exhibit a negative electron affinity (NEA) surface. NEA was generated by a lithium-oxygen...
| Main Authors: | , , , , , , , |
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| Format: | Journal Article |
| Published: |
Inderscience Publishers
2014
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| Subjects: | |
| Online Access: | http://www.inderscience.com/info/inarticle.php?artid=63789 http://hdl.handle.net/20.500.11937/40683 |