Detection of Amorphous Silica in Air-Oxidized Ti3SiC2 at 500–1000°C by NMR and SIMS
The use of secondary-ion mass spectrometry (SIMS), nuclear magnetic resonance (NMR) and transmission electron microscopy (TEM) to detect the existence of amorphous silica in Ti3SiC2 oxidised at 500–1000°C is described. The formation of an amorphous SiO2 layer and its growth in thickness with tempera...
| Main Authors: | , , |
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| Format: | Journal Article |
| Published: |
Trans Tech Publications
2010
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| Online Access: | http://hdl.handle.net/20.500.11937/38454 |