Whole-pattern profile fitting of powder diffraction data collected in parallel-beam flat-plate asymmetric reflection geometry
Abstract: A simple, physically based model that allows the whole-pattern profile fitting of diffraction data collected in parallel-beam flat-plate asymmetric reflection geometry is presented. In this arrangement, there is a fixed angle between the incident beam and the sample, resulting in a fixed-l...
| Main Authors: | , |
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| Format: | Journal Article |
| Published: |
IUCr Journals
2010
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| Online Access: | http://hdl.handle.net/20.500.11937/36885 |