Three-dimensional atom probe analysis of green- and blue-emitting In x Ga1-x NGaN multiple quantum well structures

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Three-dimensional atom probe analysis of green- and blue-emitting In x Ga1-x NGaN multiple quantum well structures

The three-dimensional atom probe has been used to characterize green- and blue-emitting Inx Ga1-x NGaN multiple quantum well structures with subnanometer resolution over a 100 nm field of view. The distribution of indium in Inx Ga1-x N samples with different compositions is analyzed. No evidence is...

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Bibliographic Details
Main Authors:	Galtrey, M., Oliver, R., Kappers, M., Humphreys, C., Clifton, P., Larson, D., Saxey, David, Cerezo, A.
Format:	Journal Article
Published:	American Institute of Physics 2008
Online Access:	http://hdl.handle.net/20.500.11937/35984

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