Three-dimensional atom probe analysis of green- and blue-emitting In x Ga1-x NGaN multiple quantum well structures
The three-dimensional atom probe has been used to characterize green- and blue-emitting Inx Ga1-x NGaN multiple quantum well structures with subnanometer resolution over a 100 nm field of view. The distribution of indium in Inx Ga1-x N samples with different compositions is analyzed. No evidence is...
| Main Authors: | , , , , , , , |
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| Format: | Journal Article |
| Published: |
American Institute of Physics
2008
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| Online Access: | http://hdl.handle.net/20.500.11937/35984 |