A vision-based approach for surface roughness assessment at micro and nano scales

Bibliographic Details
Main Authors: Al-Kindi, G., Shirinzadeh, B., Zhong, Yongmin
Other Authors: Soh Yeng Chai
Format: Conference Paper
Published: Institute of Electrical and Electronics Engineers (IEEE) 2008
Online Access:http://hdl.handle.net/20.500.11937/35904