Producing artifact-free projection overlaps with baffles
In multi-pinhole SPECT, overlapping the projections from different pinholes has been used to increase sensitivity. However, the prevailing view is that the overall quality of the reconstructed image is not improved by the projection overlaps because of the associated artifacts. On the other hand, co...
| Main Author: | |
|---|---|
| Format: | Conference Paper |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2013
|
| Online Access: | http://hdl.handle.net/20.500.11937/30486 |