Characterisation of amorphous silica in air-oxidised Ti3SiC2 at 500–1000 °C using secondary-ion mass spectrometry, nuclear magnetic resonance and transmission electron microscopy

Characterisation of amorphous silica in air-oxidised Ti3SiC2 at 500–1000 °C using secondary-ion mass spectrometry, nuclear magnetic resonance and transmission electron microscopy

In this paper we have described the use of secondary-ion mass spectrometry (SIMS), solid state 29Si magic-angle-spinning (MAS) nuclear magnetic resonance (NMR) and transmission electron microscopy (TEM) to detect the existence of amorphous silica in Ti3SiC2 oxidised at 500–1000 °C. The formation of...

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Bibliographic Details
Main Authors: Pang, W, Low, It Meng, Hanna, J.
Format: Journal Article
Published: Elsevier Science SA 2010
Online Access:http://hdl.handle.net/20.500.11937/27721

Internet

http://hdl.handle.net/20.500.11937/27721

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