The effect of grain orientation on secondary ion mass spectrometry (SIMS) analysis of rutile

The effect of grain orientation on secondary ion mass spectrometry (SIMS) analysis of rutile

In situ high precision U–Pb analysis of rutile by secondary ion mass spectrometry (SIMS) reveals that instrumental bias for isotope ratios and count rates vary due to crystal orientation. Electron backscatter diffraction (EBSD) techniques have been combined with SIMS data to show consistent and syst...

Full description

Bibliographic Details
Main Authors: Taylor, Rich, Clark, Chris, Reddy, Steven
Format: Journal Article
Published: Elsevier Science BV 2012
Subjects:
orientation effects
U–Pb
Rutile
EBSD
SIMS
Geochronology
Online Access:http://hdl.handle.net/20.500.11937/20137

Internet

http://hdl.handle.net/20.500.11937/20137

Similar Items