Nanoscale elastic-plastic deformation and stress distributions on the C plane of sapphire single crystal during nanoindentation
The nanoscale elastic-plastic characteristics of the C plane of sapphire single crystal were studied by ultra-low nanoindentation loads with a Berkovich indenter within the indentation depth less than 60 nm. The smaller the loading rate is, the greater the corresponding critical pop-in loads and the...
| Main Authors: | Mao, W., Shen, Y., Lu, Chungsheng |
|---|---|
| Format: | Journal Article |
| Published: |
Elsevier Science
2011
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.11937/19715 |
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