Nanoscale elastic-plastic deformation and stress distributions on the C plane of sapphire single crystal during nanoindentation

Nanoscale elastic-plastic deformation and stress distributions on the C plane of sapphire single crystal during nanoindentation

The nanoscale elastic-plastic characteristics of the C plane of sapphire single crystal were studied by ultra-low nanoindentation loads with a Berkovich indenter within the indentation depth less than 60 nm. The smaller the loading rate is, the greater the corresponding critical pop-in loads and the...

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Bibliographic Details
Main Authors: Mao, W., Shen, Y., Lu, Chungsheng
Format: Journal Article
Published: Elsevier Science 2011
Subjects:
Single crystal sapphire
Multiple pop-in events
Critical resolved shear stress
Nanoindentation
Mechanical properties
Online Access:http://hdl.handle.net/20.500.11937/19715

Internet

http://hdl.handle.net/20.500.11937/19715

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