A modified layer-removal method for residual stress measurement in electrodeposited nickel films

A modified layer-removal method for residual stress measurement in electrodeposited nickel films

Combining the traditional layer-removal method with a cantilever beam model, a modified layer-removal method is developed and used to measure residual stress in single and multi-layer electrodeposited nickel films with thickness of 2.5 μm. The out-of-plane displacement of the free tip of a cantileve...

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Bibliographic Details
Main Authors: Jiang, L., Peng, J., Liao, Y., Zhou, Y.C., Liang, J., Hao, H.X., Lu, Chungsheng
Format: Journal Article
Published: Elsevier Science SA 2011
Subjects:
Residual stress
Nanoindentation
Nickel
Layer-removal method
Thin films
Online Access:http://hdl.handle.net/20.500.11937/18476

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