A modified layer-removal method for residual stress measurement in electrodeposited nickel films
Combining the traditional layer-removal method with a cantilever beam model, a modified layer-removal method is developed and used to measure residual stress in single and multi-layer electrodeposited nickel films with thickness of 2.5 μm. The out-of-plane displacement of the free tip of a cantileve...
| Main Authors: | , , , , , , |
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| Format: | Journal Article |
| Published: |
Elsevier Science SA
2011
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| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.11937/18476 |