On Artifact-free Projection Overlaps in Multi-pinhole Tomographic Imaging
In multi-pinhole SPECT, overlapping the projections from different pinholes has been used to increase sensitivity. However, the prevailing view is that the overall quality of the reconstructed image is not improved by the overlaps in the projections. It is often stated in literatures that overlaps i...
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| Format: | Journal Article |
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Institute of Electrical and Electronics Engineers
2013
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| Online Access: | http://hdl.handle.net/20.500.11937/18345 |