Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
| Main Authors: | , , , , , , , , , |
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| Format: | Journal Article |
| Published: |
American Physical Society
2006
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| Online Access: | http://hdl.handle.net/20.500.11937/11072 |
| _version_ | 1848747707548565504 |
|---|---|
| author | Radny, M. Smith, P. Reusch, T. Warschkow, O. Marks, Nigel Wilson, H. Curson, N. Schofield, S. McKenzie, D. Simmons, M. |
| author_facet | Radny, M. Smith, P. Reusch, T. Warschkow, O. Marks, Nigel Wilson, H. Curson, N. Schofield, S. McKenzie, D. Simmons, M. |
| author_sort | Radny, M. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| first_indexed | 2025-11-14T06:53:26Z |
| format | Journal Article |
| id | curtin-20.500.11937-11072 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T06:53:26Z |
| publishDate | 2006 |
| publisher | American Physical Society |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-110722017-02-28T01:33:15Z Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface Radny, M. Smith, P. Reusch, T. Warschkow, O. Marks, Nigel Wilson, H. Curson, N. Schofield, S. McKenzie, D. Simmons, M. 2006 Journal Article http://hdl.handle.net/20.500.11937/11072 American Physical Society restricted |
| spellingShingle | Radny, M. Smith, P. Reusch, T. Warschkow, O. Marks, Nigel Wilson, H. Curson, N. Schofield, S. McKenzie, D. Simmons, M. Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface |
| title | Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface |
| title_full | Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface |
| title_fullStr | Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface |
| title_full_unstemmed | Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface |
| title_short | Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface |
| title_sort | importance of charging in atomic resolution scanning tunneling microscopy:study of a single phosphorus atom in a si(001) surface |
| url | http://hdl.handle.net/20.500.11937/11072 |