Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface

Bibliographic Details
Main Authors: Radny, M., Smith, P., Reusch, T., Warschkow, O., Marks, Nigel, Wilson, H., Curson, N., Schofield, S., McKenzie, D., Simmons, M.
Format: Journal Article
Published: American Physical Society 2006
Online Access:http://hdl.handle.net/20.500.11937/11072
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author Radny, M.
Smith, P.
Reusch, T.
Warschkow, O.
Marks, Nigel
Wilson, H.
Curson, N.
Schofield, S.
McKenzie, D.
Simmons, M.
author_facet Radny, M.
Smith, P.
Reusch, T.
Warschkow, O.
Marks, Nigel
Wilson, H.
Curson, N.
Schofield, S.
McKenzie, D.
Simmons, M.
author_sort Radny, M.
building Curtin Institutional Repository
collection Online Access
first_indexed 2025-11-14T06:53:26Z
format Journal Article
id curtin-20.500.11937-11072
institution Curtin University Malaysia
institution_category Local University
last_indexed 2025-11-14T06:53:26Z
publishDate 2006
publisher American Physical Society
recordtype eprints
repository_type Digital Repository
spelling curtin-20.500.11937-110722017-02-28T01:33:15Z Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface Radny, M. Smith, P. Reusch, T. Warschkow, O. Marks, Nigel Wilson, H. Curson, N. Schofield, S. McKenzie, D. Simmons, M. 2006 Journal Article http://hdl.handle.net/20.500.11937/11072 American Physical Society restricted
spellingShingle Radny, M.
Smith, P.
Reusch, T.
Warschkow, O.
Marks, Nigel
Wilson, H.
Curson, N.
Schofield, S.
McKenzie, D.
Simmons, M.
Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
title Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
title_full Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
title_fullStr Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
title_full_unstemmed Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
title_short Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface
title_sort importance of charging in atomic resolution scanning tunneling microscopy:study of a single phosphorus atom in a si(001) surface
url http://hdl.handle.net/20.500.11937/11072