Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface

Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface

Bibliographic Details
Main Authors: Radny, M., Smith, P., Reusch, T., Warschkow, O., Marks, Nigel, Wilson, H., Curson, N., Schofield, S., McKenzie, D., Simmons, M.
Format: Journal Article
Published: American Physical Society 2006
Online Access:http://hdl.handle.net/20.500.11937/11072

Internet

http://hdl.handle.net/20.500.11937/11072

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