Electric field emissions of FPGA chip based on gigahertz transverse electromagnetic cell modeling and measurement
Modern integrated circuits (ICs) are significant sources of undesired electromagnetic wave. Therefore, characterization of chip-level emission is essential to comply with EMC tests at the product level. A Gigahertz Transverse Electromagnetic (GTEM) cell is a common test instrument used to measure IC...
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| Format: | Thesis |
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2016
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| Online Access: | http://eprints.uthm.edu.my/9121/ http://eprints.uthm.edu.my/9121/1/Chua_King_Lee.pdf |