Thermal stress test for PLED
This work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from t...
Main Authors: | Yap, B.K., Koh, S.P., Tiong, S.K., Ong, C.N. |
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Format: | Conference Paper |
Language: | en_US |
Published: |
2017
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Online Access: | IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 2010, Article number 5549354, Pages 370-372 |
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