Polarized infrared reststrahlen features of wurtzite ingan thin film
Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure Ino.92GaoosN thin film grown by molecular beam epitaxy· Composition dependence of IR reststrahlen features was observed. Theoretical polarized ~ reflectance spectrum was s...
| Main Authors: | , , , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2014
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| Subjects: | |
| Online Access: | http://eprints.um.edu.my/15939/ http://eprints.um.edu.my/15939/1/0001.pdf |