Physical and dispersive optical characteristics of ZrON/Si thin-film system

To date, the complex evaluation of physical and dispersive optical characteristics of the ZrON/Si film system has yet been reported. Hence, ZrON thin films have been formed on Si(100) substrates through oxidation/nitridation of sputtered metallic Zr in N2O environment at 500, 700, and 900 ∘C. Physic...

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Bibliographic Details
Main Authors: Wong, Y.H., Atuchin, V.V., Kruchinin, V.N., Cheong, K.Y.
Format: Article
Published: Springer Verlag (Germany) 2014
Subjects:
Online Access:http://link.springer.com/article/10.1007%2Fs00339-013-7947-1
http://link.springer.com/article/10.1007%2Fs00339-013-7947-1