Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder

The electrical conductivity of pure Cu powder is typically deteriorated at elevated temperatures due to the oxidation by forming non-conducting oxides on surface, while enhancing oxidation resistance via alloying is often accompanied by a drastic decline of electrical conductivity. Obtaining Cu powd...

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Main Authors: Li, Jiaxiang, Li, Yunping, Wang, Zhongchang, Bian, Huakang, Hou, Yuhang, Wang, Fenglin, Xu, Guofu, Liu, Bin, Liu, Yong
Format: Online
Language:English
Published: Nature Publishing Group 2016
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5177874/
id pubmed-5177874
recordtype oai_dc
spelling pubmed-51778742016-12-29 Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder Li, Jiaxiang Li, Yunping Wang, Zhongchang Bian, Huakang Hou, Yuhang Wang, Fenglin Xu, Guofu Liu, Bin Liu, Yong Article The electrical conductivity of pure Cu powder is typically deteriorated at elevated temperatures due to the oxidation by forming non-conducting oxides on surface, while enhancing oxidation resistance via alloying is often accompanied by a drastic decline of electrical conductivity. Obtaining Cu powder with both a high electrical conductivity and a high oxidation resistance represents one of the key challenges in developing next-generation electrical transferring powder. Here, we fabricate a Cu-Ag powder with a continuous Ag network along grain boundaries of Cu particles and demonstrate that this new structure can inhibit the preferential oxidation in grain boundaries at elevated temperatures. As a result, the Cu-Ag powder displays considerably high electrical conductivity and high oxidation resistance up to approximately 300 °C, which are markedly higher than that of pure Cu powder. This study paves a new pathway for developing novel Cu powders with much enhanced electrical conductivity and oxidation resistance in service. Nature Publishing Group 2016-12-22 /pmc/articles/PMC5177874/ /pubmed/28004839 http://dx.doi.org/10.1038/srep39650 Text en Copyright © 2016, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
repository_type Open Access Journal
institution_category Foreign Institution
institution US National Center for Biotechnology Information
building NCBI PubMed
collection Online Access
language English
format Online
author Li, Jiaxiang
Li, Yunping
Wang, Zhongchang
Bian, Huakang
Hou, Yuhang
Wang, Fenglin
Xu, Guofu
Liu, Bin
Liu, Yong
spellingShingle Li, Jiaxiang
Li, Yunping
Wang, Zhongchang
Bian, Huakang
Hou, Yuhang
Wang, Fenglin
Xu, Guofu
Liu, Bin
Liu, Yong
Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder
author_facet Li, Jiaxiang
Li, Yunping
Wang, Zhongchang
Bian, Huakang
Hou, Yuhang
Wang, Fenglin
Xu, Guofu
Liu, Bin
Liu, Yong
author_sort Li, Jiaxiang
title Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder
title_short Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder
title_full Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder
title_fullStr Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder
title_full_unstemmed Ultrahigh Oxidation Resistance and High Electrical Conductivity in Copper-Silver Powder
title_sort ultrahigh oxidation resistance and high electrical conductivity in copper-silver powder
description The electrical conductivity of pure Cu powder is typically deteriorated at elevated temperatures due to the oxidation by forming non-conducting oxides on surface, while enhancing oxidation resistance via alloying is often accompanied by a drastic decline of electrical conductivity. Obtaining Cu powder with both a high electrical conductivity and a high oxidation resistance represents one of the key challenges in developing next-generation electrical transferring powder. Here, we fabricate a Cu-Ag powder with a continuous Ag network along grain boundaries of Cu particles and demonstrate that this new structure can inhibit the preferential oxidation in grain boundaries at elevated temperatures. As a result, the Cu-Ag powder displays considerably high electrical conductivity and high oxidation resistance up to approximately 300 °C, which are markedly higher than that of pure Cu powder. This study paves a new pathway for developing novel Cu powders with much enhanced electrical conductivity and oxidation resistance in service.
publisher Nature Publishing Group
publishDate 2016
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5177874/
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