Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy

Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy

Atomic force microscopy (AFM) force-distance measurements are used to investigate the layered ion structure of Ionic Liquids (ILs) at the mica surface. The effects of various tip properties on the measured force profiles are examined and reveal that the measured ion position is independent of tip pr...

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Bibliographic Details
Main Authors: Black, Jennifer M., Zhu, Mengyang, Zhang, Pengfei, Unocic, Raymond R., Guo, Daqiang, Okatan, M. Baris, Dai, Sheng, Cummings, Peter T., Kalinin, Sergei V., Feng, Guang, Balke, Nina
Format: Online
Language:English
Published: Nature Publishing Group 2016
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5009352/

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https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5009352/

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