Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
3D InGaN/GaN microstructures grown by metal organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) have been extensively studied using a range of electron microscopy techniques. The growth of material by MBE has led to the growth of cubic GaN material. The changes in these crystal phas...
| Main Authors: | , , , , , , , |
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| Format: | Online |
| Language: | English |
| Published: |
John Wiley and Sons Inc.
2015
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4989450/ |