Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis

► AlN and TiN layers are always in tension and compression at interface, respectively. ► Curvature of the bending is largest for the TiN/AlN thickness ratios ∼0.5 and ∼2. ► Curvature is maximum for equal number of TiN and AlN layers in multilayer film. ► Curvature is decreases with increasing the no...

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Bibliographic Details
Main Authors: Chawla, Vipin, Holec, David, Mayrhofer, Paul H.
Format: Online
Language:English
Published: Elsevier Science Pub. Co 2012
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4986319/