Optimizing Silicon Oxide Embedded Silicon Nanocrystal Inter-particle Distances

We demonstrate an analytical method to optimize the stoichiometry and thickness of multilayer silicon oxide films in order to achieve the highest density of non-touching and closely spaced silicon nanocrystals after annealing. The probability of a nanocrystal nearest-neighbor distance within a limit...

Full description

Bibliographic Details
Main Authors: van Sebille, Martijn, Allebrandi, Jort, Quik, Jim, van Swaaij, René A.C. M. M., Tichelaar, Frans D., Zeman, Miro
Format: Online
Language:English
Published: Springer US 2016
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4974215/