An Accurate Value for the Absorption Coefficient of Silicon at 633 nm
High-accuracy transmission measurements at an optical wavelength of 633 nm and mechanical measurements of the thickness of a 13-µm thick silicon-crystal film have been used to calculate the absorption and extinction coefficients of silicon at 633 nm. The results are 3105±62 cm−1 and 0.01564±0.00031,...
| Main Authors: | , , , , |
|---|---|
| Format: | Online |
| Language: | English |
| Published: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1990
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4930019/ |