X-Ray Diffraction Line Broadening: Modeling and Applications to High-Tc Superconductors
A method to analyze powder-diffraction line broadening is proposed and applied to some novel high-Tc superconductors. Assuming that both size-broadened and strain-broadened profiles of the pure-specimen profile are described with a Voigt function, it is shown that the analysis of Fourier coefficient...
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| Format: | Online |
| Language: | English |
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[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1993
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4914239/ |