De novo phasing with optimized XFEL data
Nass et al. [IUCrJ (2016), 3, 180–191] have demonstrated that serial femtosecond crystallography (SFX) data collected at X-ray free-electron lasers (XFELs) can be successfully phased using only the weak anomalous scattering from the native S atoms.
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| Format: | Online |
| Language: | English |
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International Union of Crystallography
2016
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4856137/ |